ANALYSE THE CHEMICAL COMPOSITION OF SURFACE LAYERS
Surface analysis techniques are routinely applied to a broad range of materials, such as aluminum and stainless steel, during and after manufacturing.
TYPE OF SURFACE ANALYSIS
1) X-ray Photoelectron Spectroscopy (XPS)
This technique is used to identify and quantify the elements present on a surface and their chemical state by analyzing the energy of photoelectrons generated by the photoelectric effect.
2) Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a high-sensitivity surface analysis testing technique.
3) Inductively coupled plasma atomic emission spectroscopy (ICP-AES)
Inductively coupled plasma atomic emission spectroscopy (ICP-AES) is an emission spectroscopy method that excites atoms and ions in a plasma.
APPLICATION OF SURFACE TESTING
XPS irradiates a material's surface with x-rays and detects the electrons ejected from the surface
TOF-SIMS provides detailed inorganic and organic information about the wafer surface
XPS irradiates the surface of a material with x-rays and detecting the electrons that are ejected from the surface.
TOF-SIMS provides detailed inorganic and organic information about the wafer surface.
ICP-AES is an analytical technique used for the detection of chemical elements by applying emission spectroscopy
ICP-AES is an analytical technique used for the detection of chemical elements by applying emission spectroscopy
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Our state-of-the-arts hydrogen embrittlement testing lab can carry out HISC testing on nickel alloys and duplex stainless steels to investigate how hydrogen influences materials’ behaviour under mechanical stress.
For more information about how we perform Hydrogen Embrittlement (HE) Testing, call us or send us an enquiry today.
