HIGH-RESOLUTION MICROSCOPIC IMAGE WITH SEM-EDX ANALYSIS
A scanning electron microscope (SEM) projects use an electron beam. It scans a focused stream of electrons over a surface to create an image with a resolution of less than 1 nm, much higher than a light microscope. An Energy Dispersive X-Ray analyser (EDX or EDA) is also used to identify the elemental composition of materials. After combining these two techniques, a sharp picture of the microscopic surface structures of the sample will be generated, providing accurate information about its elemental composition.
EDX systems are attached to Electron Microscopy instruments (Scanning Electron Microscopy (SEM) where the imaging capability of the microscope identifies the specimen of interest. The data generated by EDX analysis consist of spectra showing peaks corresponding to the elements making up the true composition of the sample being analysed. Elemental mapping of a sample and image analysis are also possible.
THE MAIN SEM COMPONENTS INCLUDE:
Sample chamber
Computer and display to view the images
Electron detector
Column down which electrons travel with electromagnetic lenses
Source of electrons
Energy Dispersive X-ray Analyser
Energy Dispersive X-ray Analyser
Application of SEM-EDX analysis:
SEM has a large depth of field, which allows more of a specimen to be in focus at one time
Higher resolution, so closely spaced specimens can be magnified at much higher levels
SEM with EDX provides qualitative elemental analysis, quantitative analysis, x-ray line scans, and mapping
Common Test Methods
ASTM B748
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Professional Testing Services offer SEM-EDS analysis services in our state-of-the-art laboratory. Our expert testing team will determine the elemental composition of materials from metals to biological tissues.
For more information on our SEM-EDX analysis, call us or send us an enquiry today.
